Ordinary refractive index of sapphire in uniaxial tension and compression along the c axis

Journal of Applied Physics

Volumn 93, Issue 2, 2003, Pages 1023-1031

  Jones, S C ^a,b   Robinson, M C ^a   Gupta, Y M ^a  

^a WASHINGTON STATE UNIVERSITY   (United States)

^b SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETERS; REFRACTIVE INDEX; SINGLE CRYSTALS; STRAIN; STRESS ANALYSIS; TENSILE TESTING;

UNIAXIAL TENSION;

SAPPHIRE;

EID: 0037439427     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1530716     Document Type: Article

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