Refractive index of sapphire at 532 nm under shock compression and release

Journal of Applied Physics

Volumn 91, Issue 5, 2002, Pages 2833-2841

  Setchell, Robert E ^a  

^a SANDIA NATIONAL LABORATORIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33845417732     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1446219     Document Type: Article

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