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Volumn 10, Issue 44, 1998, Pages 9969-9974
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Small-angle x-ray scattering of porous silicon at two different wavelengths
a a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0041388379
PISSN: 09538984
EISSN: None
Source Type: Journal
DOI: 10.1088/0953-8984/10/44/005 Document Type: Article |
Times cited : (19)
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References (11)
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