SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 276, Issue 1-2, 1996, Pages 65-68

Bimodal size distribution in p- porous silicon studied by small angle X-ray scattering

(6) Binder, M a Edelmann, T a Metzger, T H a Mauckner, G b Goerigk, G c Peisl, J a

a UNIVERSITY OF MUNICH (Germany)

b UNIVERSITY OF ULM (Germany)

c FORSCHUNGSZENTRUM JÜLICH (Germany)

Author keywords

Silicon; Structural properties; X ray scattering

Indexed keywords

CRYSTAL STRUCTURE; DOPING (ADDITIVES); LIGHT ABSORPTION; MORPHOLOGY; PARTICLE SIZE ANALYSIS; PHOTOLUMINESCENCE; POROSITY; SYNCHROTRON RADIATION; X RAY ANALYSIS;

BIMODAL SIZE DISTRIBUTION; FREE STANDING FILMS; SMALL ANGLE X RAY SCATTERING;

POROUS SILICON;

EID: 0030120539 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/0040-6090(95)08047-3 Document Type: Article

Times cited : (16)

References (15)

1
- 0141775174
- L.T. Canham, Appl. Phys. Lett., 57 (1990) 1046.
- (1990) Appl. Phys. Lett. , vol.57 , pp. 1046
- Canham, L.T.¹

2
- 1842595981
- V. Lehmann and U. Gösele, Appl Phys. Lett., 58(1991) 856.
- (1991) Appl Phys. Lett. , vol.58 , pp. 856
- Lehmann, V.¹ Gösele, U.²

3
- 0026205766
- A. Bsiesy, J.C. Vial, F. Gaspard, R. Hérino, M. Ligeon, F. Muller, R. Romestain, A. Wasiela, A. Halimaoui and G. Bomchil, Surf. Sci., 254 (1991) 195.
- (1991) Surf. Sci. , vol.254 , pp. 195
- Bsiesy, A.¹ Vial, J.C.² Gaspard, F.³ Hérino, R.⁴ Ligeon, M.⁵ Muller, F.⁶ Romestain, R.⁷ Wasiela, A.⁸ Halimaoui, A.⁹ Bomchil, G.¹⁰

4
- 0000165513
- J.C. Vial, A. Bsiesy, F. Gaspard, R. Hérino, M. Ligeon, F. Muller and R. Romestain and R.M. Macfarlane, Phys. Rev. B, 45 (1992) 14171.
- (1992) Phys. Rev. B , vol.45 , pp. 14171
- Vial, J.C.¹ Bsiesy, A.² Gaspard, F.³ Hérino, R.⁴ Ligeon, M.⁵ Muller, F.⁶ Romestain, R.⁷ Macfarlane, R.M.⁸

5
- 30244498835
- Doctoral Thesis, University of Ulm, to be published
- G. Maukner, Doctoral Thesis, University of Ulm, 1995, to be published.
- (1995)
- Maukner, G.¹

6
- 0005380987
- V. Vezin, P. Goudeau and A. Naudon, Appl. Phys. Lett., 60 (1992) 2625.
- (1992) Appl. Phys. Lett. , vol.60 , pp. 2625
- Vezin, V.¹ Goudeau, P.² Naudon, A.³

7
- 0026243803
- V. Vezin, P. Goudeau, A. Naudon, R. Hérino and G. Bomchil, J. Appl. Cryst., 24 (1991) 581.
- (1991) J. Appl. Cryst. , vol.24 , pp. 581
- Vezin, V.¹ Goudeau, P.² Naudon, A.³ Hérino, R.⁴ Bomchil, G.⁵

8
- 0000148606
- P. Goudeau, A. Naudon, G. Bomchil and R. Herino, J. Appl. Phys., 66 (1989) 625.
- (1989) J. Appl. Phys. , vol.66 , pp. 625
- Goudeau, P.¹ Naudon, A.² Bomchil, G.³ Herino, R.⁴

9
- 4243197814
- A. Naudon, P. Goudeau, A. Halimaoui, B. Lambert and G. Bomchil, J. Appl. Phys., 75 (1994) 780.
- (1994) J. Appl. Phys. , vol.75 , pp. 780
- Naudon, A.¹ Goudeau, P.² Halimaoui, A.³ Lambert, B.⁴ Bomchil, G.⁵

10
- 0027268756
- H. Franz, V. Petrova-Koch, T. Muschnik and J. Peisl, Mater. Res. Soc. Proc., 283 (1993) 133.
- (1993) Mater. Res. Soc. Proc. , vol.283 , pp. 133
- Franz, H.¹ Petrova-Koch, V.² Muschnik, T.³ Peisl, J.⁴

11
- 0028407103
- S. Schuppler, L. Friedmann, M. Marcus, D. Adler, Y.-H. Xie, F. Ross, T. Harris, W. Brown, Y. Chabal, L. Brus and P. Citrin, Phys. Rev. Lett., 72 (1994) 2648.
- (1994) Phys. Rev. Lett. , vol.72 , pp. 2648
- Schuppler, S.¹ Friedmann, L.² Marcus, M.³ Adler, D.⁴ Xie, Y.-H.⁵ Ross, F.⁶ Harris, T.⁷ Brown, W.⁸ Chabal, Y.⁹ Brus, L.¹⁰ Citrin, P.¹¹

12
- 0001618375
- Haubold, H.G. et al., Rev. Sci. Instrum., 60 (1989) 1943.
- (1989) Rev. Sci. Instrum. , vol.60 , pp. 1943
- Haubold, H.G.¹

13
- 0003519476
- Wiley, New York
- A. Guinier and G. Fournet, Small-Angle Scattering of X-Rays, Wiley, New York, 1955.
- (1955) Small-angle Scattering of X-rays
- Guinier, A.¹ Fournet, G.²

14
- 0003702492
- O. Glatter and O. Kratky (eds.), Academic Press, London
- G. Porod, in O. Glatter and O. Kratky (eds.), Small-Angle X-ray Scattering, Academic Press, London, 1982.
- (1982) Small-angle X-ray Scattering
- Porod, G.¹

15
- 25744465277
- H.D. Bale, P.W. Schmidt, Phys. Rev. Lett., 53 (1984) 594.
- (1984) Phys. Rev. Lett. , vol.53 , pp. 594
- Bale, H.D.¹ Schmidt, P.W.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.