Performance of advanced a-Si/CsI-based flat panel x-ray detectors for mammography

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5030 II, Issue , 2003, Pages 553-563

  Albagli, D ^a,c   Hudspeth, H ^a   Possin, G ^a   Lee, J ^a   Granfors, P ^b   Giambattista, B ^b  

^a GE Global Research Center   (United States)

^b GE Medical Systems   (United States)

^c GE GLOBAL RESEARCH   (United States)

Author keywords

Amorphous silicon; Detective quantum efficiency; DQE; FFDM; Flat panel detector; Full field digital mammography

Indexed keywords

AMORPHOUS SILICON; FLAT PANEL DISPLAYS; LIGHT MODULATION; OPTICAL TRANSFER FUNCTION; PHOSPHORS; QUANTUM EFFICIENCY; RADIATION DETECTORS; X RAY OPTICS;

DIGITAL MAMMOGRAPHY;

MAMMOGRAPHY;

EID: 0041374313     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.480010     Document Type: Conference Paper

References (9)

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