Reduced-dimension and wavelet processing of SMD images for real-time inspection

Proceedings of the IEEE Southwest Symposium on Image Analysis and Interpretation

Volumn , Issue , 1996, Pages 30-36

  Gallegos, J Mario ^a   Villalobos, J Rene ^a   Carrillo, Gerardo ^a   Cabrera, Sergio D ^a  

^a UNIVERSITY OF TEXAS AT EL PASO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; INSPECTION; PRINTED CIRCUIT TESTING; SURFACE MOUNT TECHNOLOGY; WAVELET TRANSFORMS;

AUTOMATED VISUAL INSPECTION; LINEAR IMAGE PROJECTION; REAL TIME INSPECTION;

IMAGE PROCESSING;

EID: 0029698741     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)