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Volumn 1998-R, Issue , 1998, Pages 767-777

A SYSTEM FOR FIRST ORDER RELIABILITY ESTIMATION OF SOLDER JOINTS IN AREA ARRAY PACKAGES

Author keywords

[No Author keywords available]

Indexed keywords

FATIGUE OF MATERIALS; MOIRE FRINGES; NEURAL NETWORKS; RELIABILITY ANALYSIS;

EID: 0041167439     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE1998-1091     Document Type: Conference Paper
Times cited : (2)

References (22)
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  • 2
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    • Corbin, J. S., 1993, “Finite Element Analysis for Solder Ball Connect (SBC) structural design optimization,” IBM Journal of Research and Development, Vol. 37, pp. 585-596.
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  • 3
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    • June 1992
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  • 4
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    • Reliability of Plastic Ball Grid Array Assembly
    • K.. and, J.H. Low (editor). McGraw Hill, Inc
    • Darveaux, Banerji, K.. Mawer, A. and Doddy, G.,1995, "Reliability of Plastic Ball Grid Array Assembly,” Ball Grid Technology, J.H. Low (editor). McGraw Hill, Inc.
    • (1995) Ball Grid Technology
    • Darveaux, Banerji1    Mawer, A.2    Doddy, G.3
  • 5
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    • Maximizing Solder Joint Reliability through Optimal Shape Design
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    • (1997) Journal of Electronic Packaging , vol.119 , Issue.3 , pp. 149-155
    • Deshpande, A.M.1    Subbarayan, G.2    Mahajan., R.L.3
  • 7
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    • Solder Ball Connect (SBC) Assemblies under Thermal Loading: I. Deformation Measurement via Moire Interferometry, and its Interpretation
    • Guo, Y„ Lim. C.K., Chen, W.T.. Woychik, C.G.,1993, "Solder Ball Connect (SBC) Assemblies under Thermal Loading: I. Deformation Measurement via Moire Interferometry, and its Interpretation,” IBM Journal of Research and Development. Vol. 37. pp.635-647.
    • (1993) IBM Journal of Research and Development , vol.37 , pp. 635-647
    • Guo, Y„ Lim. C.K.1    Chen, W.T.2    Woychik, C.G.3
  • 12
    • 0030231010 scopus 로고    scopus 로고
    • Prediction of Fatigue Failure of 60Sn-40Pb solder Using Constitutive Model for Cyclic Viscoplasticity
    • Sept. 1996
    • Lshikawa, H., Sasaki, K., and Ohguchi, K.. 1996, "Prediction of Fatigue Failure of 60Sn-40Pb solder Using Constitutive Model for Cyclic Viscoplasticity," Journal of Electronic Packaging, Sept. 1996. Vol. 118, pp. 164-169.
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  • 13
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    • Lochner, R. H.1    Matar, J.E.2
  • 14
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    • Behavior of Materials under Conditions of Thermal stress
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    • Subbarayan, G., 1996a, "A procedure for Automated Profile and Life Prediction in Flip-Chip and BGA Solder Joints," Journal of Electronic Packaging. Sept 1996. Vol.118, pp.127-333.
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.