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Journal of Applied Physics

Volumn 87, Issue 3, 2000, Pages 1379-1386

Nanoscale compositional analysis of Fe/Tb multilayers: A field ion microscopy and tomographic atom probe study

(3) Veiller, L a Danoix, F a Teillet, J a

a Site Universitaire Du Madrillet (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040744413 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.372024 Document Type: Article

Times cited : (10)

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