Interfacial diffusion studies in Co-Pd layered films

Journal of Magnetism and Magnetic Materials

Volumn 156, Issue 1-3, 1996, Pages 83-84

  Baker, A M ^a   Cerezo, A ^a   Petford Long, A K ^a  

^a UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; COBALT; CRYSTAL STRUCTURE; DIFFUSION; GRAIN BOUNDARIES; INTERFACES (MATERIALS); MAGNETIC STORAGE; MICROSCOPIC EXAMINATION; MULTILAYERS; PALLADIUM; TRANSMISSION ELECTRON MICROSCOPY; VACUUM TECHNOLOGY;

COBALT PALLADIUM BILAYERS; DIFFUSION RATES; INTERFACIAL DIFFUSION; MULTILAYER FILMS; POSITION SENSITIVE ATOM PROBE MICROANALYSIS;

MAGNETIC FILMS;

EID: 0030120968     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-8853(95)00797-0     Document Type: Article

References (2)

1. F.J.A. den Broeder D. Kuiper H.J.G. Draaisma IEEE Trans. Magn. 23 1987 3696
2. S. Shin Appl. Surf. Sci. 65/66 1993 110