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Volumn 94-95, Issue , 1996, Pages 306-312
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Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP
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Author keywords
[No Author keywords available]
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Indexed keywords
CHARACTERIZATION;
COMPOSITION;
CRYSTAL STRUCTURE;
FILM GROWTH;
INTERDIFFUSION (SOLIDS);
INTERFACES (MATERIALS);
NICKEL;
RUTHERFORD BACKSCATTERING SPECTROSCOPY;
SECONDARY ION MASS SPECTROMETRY;
SPUTTER DEPOSITION;
ZIRCONIUM;
ATOM PROBE FIELD ION MICROSCOPY;
INTERDIFFUSION COEFFICIENT;
REACTION ZONE;
TOMOGRAPHIC ATOM PROBE;
TRANSIENT REGION;
MULTILAYERS;
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EID: 0030562667
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/0169-4332(95)00391-6 Document Type: Article |
Times cited : (18)
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References (13)
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