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Volumn 94-95, Issue , 1996, Pages 306-312

Characterization of sputter-deposited multilayers of Ni and Zr with APFIM/TAP

Author keywords

[No Author keywords available]

Indexed keywords

CHARACTERIZATION; COMPOSITION; CRYSTAL STRUCTURE; FILM GROWTH; INTERDIFFUSION (SOLIDS); INTERFACES (MATERIALS); NICKEL; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SECONDARY ION MASS SPECTROMETRY; SPUTTER DEPOSITION; ZIRCONIUM;

EID: 0030562667     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/0169-4332(95)00391-6     Document Type: Article
Times cited : (18)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.