SCOPUS 정보 검색 플랫폼

Volumn 73, Issue 11, 1998, Pages 1541-1543

Dynamics of recombination-enhanced defect reaction in a ZnCdSe single quantum well

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EID: 0040621055 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.122199 Document Type: Article

Times cited : (8)

References (7)

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- C. Jordan, D. T. Fewer, J. F. Donegan, E. M. McCabe, A. Huynh, F. P. Logue, S. Taniguchi, T. Hino, K. Nakano, and A. Ishibashi, Appl. Phys. Lett. 72, 194 (1998).
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