Atomistic study of the (001), 90° twist boundary in silicon

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 77, Issue 1, 1998, Pages 55-65

  Belov, A Yu ^a,b   Conrad, D ^a   Scheerschmid, K ^a   Gosele U ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b SHUBNIKOV INSTITUTE OF CRYSTALLOGRAPHY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040041998     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619808214230     Document Type: Article

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