Spectroscopic photon emission measurements of n-channel MOSFETs biased into snapback breakdown using a continuous-pulsing transmission line technique

Semiconductor Science and Technology

Volumn 12, Issue 6, 1997, Pages 662-671

  Teh, G L ^a   Chim, W K ^a   Swee, Y K ^b   Co, Y K ^b  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039856960     PISSN: 02681242     EISSN: None     Source Type: Journal    
DOI: 10.1088/0268-1242/12/6/004     Document Type: Article

References (28)

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