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Volumn 49, Issue 1-4, 1993, Pages 147-158

ELD - a computer program system for extracting intensities from electron diffraction patterns

Author keywords

[No Author keywords available]

Indexed keywords

CAMERAS; CHARGE COUPLED DEVICES; COMPUTER AIDED ANALYSIS; COMPUTER SOFTWARE; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; PERSONAL COMPUTERS; REFLECTION;

EID: 0027544370     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/0304-3991(93)90221-I     Document Type: Article
Times cited : (89)

References (13)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.