Imaging and modeling of nanocrystalline Xe in Al containing defects

Materials Science and Engineering: A

Volumn 285, Issue 1-2, 2000, Pages 85-90

  Furuya, Kazuo ^a   Mitsuishi, Kazutaka ^a   Ishikawa, Nobuhiro ^a   Allen, Charles W ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Cuboctahedron; OB HRTEM; Partial dislocation; Stacking fault; Xe nanocrystal

Indexed keywords

CRYSTALLOGRAPHY; DISLOCATIONS (CRYSTALS); HIGH RESOLUTION ELECTRON MICROSCOPY; MATHEMATICAL MODELS; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PRECIPITATION (CHEMICAL); STACKING FAULTS; STRAIN; TRANSMISSION ELECTRON MICROSCOPY; XENON;

OFF-BRAGG HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (OB-HRTEM);

ALUMINUM;

EID: 0039766773     PISSN: 09215093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0921-5093(00)00673-0     Document Type: Article

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