Modeling of precipitated Xe atoms in aluminum and the Fresnel effect in HRTEM imaging

Nanostructured Materials

Volumn 8, Issue 7, 1997, Pages 899-908

  Awaji, M ^a,b   Ishikawa, N ^a   Furuya, K ^a  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL ORIENTATION; ELECTRON MICROSCOPY; PRECIPITATION (CHEMICAL); XENON;

FRESNEL DIFFRACTION;

ALUMINUM;

EID: 0031246974     PISSN: 09659773     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0965-9773(98)00015-4     Document Type: Article

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