In-situ observation of shape and atomic structure of Xe nanocrystals embedded in aluminium

Journal of Microscopy

Volumn 194, Issue 1, 1999, Pages 152-160

  Furuya, K ^a   Ishikawa, N ^a   Allen, C W ^b  

^a NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^b ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Cuboctahedral crystal; High resolution electron microscopy; Off axial imaging technique; Xe nanocrystals

Indexed keywords

ALUMINUM; ATOMS; CRYSTAL ATOMIC STRUCTURE; ELECTRON IRRADIATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; POINT DEFECTS;

AXIAL IMAGING; CUBOCTAHEDRAL; CUBOCTAHEDRAL CRYSTAL; DEFOCUSING; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IN-SITU OBSERVATIONS; OFF-AXIAL IMAGING TECHNIQUE; TRANSMISSION ELECTRON MICROSCOPY IMAGES; XE NANOCRYSTAL; ZONE AXIS;

NANOCRYSTALS;

ALUMINUM; NANOPARTICLE; XENON;

ARTICLE; ATOM; CRYSTAL; ELECTRON RADIATION; IMAGE ANALYSIS; PRIORITY JOURNAL; SIMULATION; STRUCTURE ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0033005957     PISSN: 00222720     EISSN: None     Source Type: Journal    
DOI: 10.1046/j.1365-2818.1999.00451.x     Document Type: Article

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