The Scanning-Tunneling Microscopy, the X-Ray Photoelectron Spectroscopy, the Inner-Shell-Electron Energy-Loss Spectroscopy Studies ofMTe2andM3SiTe6(M=Nb and Ta)

Journal of Solid State Chemistry

Volumn 142, Issue 1, 1999, Pages 63-73

  Ohno, Youichi ^a  

^a UTSUNOMIYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0039256686     PISSN: 00224596     EISSN: None     Source Type: Journal    
DOI: 10.1006/jssc.1998.7986     Document Type: Article

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