Examination of the corrugated surfaces of NbTe2 and WTe2 by scanning tunneling and atomic force microscopy

New Journal of Chemistry

Volumn 20, Issue 3, 1996, Pages 287-294

  Bengel, H ^a   Cantow, H J ^a   Magonov, S N ^b   Jung, D ^c   Ren, J ^d   Whangbo, M H ^d  

^a UNIVERSITY OF FREIBURG   (Germany)

^b Digital Instruments   (United States)

^c Wonkwang University   (South Korea)

^d NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001695968     PISSN: 11440546     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (28)

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