Fullerene functionalized scanning tunneling microscope tips-preparation, characterization and applications

Synthetic Metals

Volumn 86, Issue 1-3, 1997, Pages 2407-2410

  Kelly, Kevin F ^a   Sarkar, Dipankar ^a   Oldenburg, Steven J ^a   Hale, G D ^a   Halas, N J ^a  

^a RICE UNIVERSITY   (United States)

Author keywords

Fullerenes and derivatives; Graphite and related compounds; Scanning tunneling microscopy; Surface defects

Indexed keywords

ADSORPTION; DERIVATIVES; ELECTRON SCATTERING; ELECTRONIC DENSITY OF STATES; FERMI LEVEL; GRAPHITE; MOLECULES; POINT DEFECTS; SCANNING TUNNELING MICROSCOPY; SURFACES;

SCANNING TUNNELING MICROSCOPE TIPS; SURFACE DEFECTS;

FULLERENES;

EID: 0039245199     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0379-6779(97)81180-0     Document Type: Article

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