In situ control and analysis of the scanning tunneling microscope tip by formation of sharp needles on the Si sample and W tip

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 14, Issue 2, 1996, Pages 1522-1526

  Heike, S ^a   Hashizume, T ^a   Wada, Y ^a  

^a HITACHI LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0040528673     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.589131     Document Type: Article

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