Transmission electron microscopy of the AlN-SiC interface

Philosophical Magazine A: Physics of Condensed Matter, Structure, Defects and Mechanical Properties

Volumn 74, Issue 3, 1996, Pages 777-789

  Ponce, F A ^a   O'Keefe M A ^b   Nelson, E C ^b  

^a PALO ALTO RESEARCH CENTER   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0030237629     PISSN: 01418610     EISSN: None     Source Type: Journal    
DOI: 10.1080/01418619608243541     Document Type: Article

References (16)

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