-
1
-
-
21544462953
-
Silicon-to-silicon direct bonding method
-
Shimbo M., Furukawa K., Fukuda K., Tanzawa K. Silicon-to-silicon direct bonding method. J Appl Phys. 60(8):1986;2987.
-
(1986)
J Appl Phys
, vol.60
, Issue.8
, pp. 2987
-
-
Shimbo, M.1
Furukawa, K.2
Fukuda, K.3
Tanzawa, K.4
-
2
-
-
0023043012
-
Wafer bonding for silicon-on-insulator technologies
-
Lasky J.B. Wafer bonding for silicon-on-insulator technologies. Appl Phys Lett. 48:1986;78.
-
(1986)
Appl Phys Lett
, vol.48
, pp. 78
-
-
Lasky, J.B.1
-
4
-
-
0001159302
-
Bubble-free wafer bonding of GaAs and InP on silicon in a microcleanroom
-
Lehmann V., Mitani K., Stengl R., Mii T., Goesele U. Bubble-free wafer bonding of GaAs and InP on silicon in a microcleanroom. Jpn J Appl Phys. 28(12):1989;L2141.
-
(1989)
Jpn J Appl Phys
, vol.28
, Issue.12
, pp. 2141
-
-
Lehmann, V.1
Mitani, K.2
Stengl, R.3
Mii, T.4
Goesele, U.5
-
5
-
-
0000472026
-
Smart-cut: A new silicon on insulator material technology based on hydrogen implantation and wafer Bonding
-
Bruel M., Aspar B., Auberton-Herve A.J. Smart-cut. a new silicon on insulator material technology based on hydrogen implantation and wafer Bonding Jpn J Appl Phys. 36:1997;1636.
-
(1997)
Jpn J Appl Phys
, vol.36
, pp. 1636
-
-
Bruel, M.1
Aspar, B.2
Auberton-Herve, A.J.3
-
8
-
-
0037980911
-
Effect of moving velocity of the heat source on bonding strength in the direct silicon wafer using linear annealing method
-
Joo Y.C., Lee J.W., Song O.S., Joo Y.C., Kang C.S. Effect of moving velocity of the heat source on bonding strength in the direct silicon wafer using linear annealing method. J Korean Inst Met Mater. 39(1):2001;110.
-
(2001)
J Korean Inst Met Mater
, vol.39
, Issue.1
, pp. 110
-
-
Joo, Y.C.1
Lee, J.W.2
Song, O.S.3
Joo, Y.C.4
Kang, C.S.5
-
9
-
-
0035439352
-
Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS
-
Jensen B.D., de Boer M.P., Masters N.D., Bitsie F., LaVan D.A. Interferometry of actuated microcantilevers to determine material properties and test structure nonidealities in MEMS. J Micro Syst. 10:2001;336.
-
(2001)
J Micro Syst
, vol.10
, pp. 336
-
-
Jensen, B.D.1
De Boer, M.P.2
Masters, N.D.3
Bitsie, F.4
LaVan, D.A.5
-
10
-
-
0034998411
-
Continuous on-chip micropumping through a microneedle
-
Microelectro Mechanical Systems, MEMS 2001.Interlaken, Switzerland
-
Zahn JD, Deshmukh AA, Pisano AP, Liepmann D. Continuous on-chip micropumping through a microneedle. In: Microelectro mechanical systems, MEMS 2001. The 14th IEEE International Conference proceedings, Interlaken, Switzerland, 2001. p. 503.
-
(2001)
The 14th IEEE International Conference Proceedings
, pp. 503
-
-
Zahn, J.D.1
Deshmukh, A.A.2
Pisano, A.P.3
Liepmann, D.4
-
13
-
-
0030737147
-
The crack opening method in silicon wafer bonding. How useful is it?
-
Martini T., Steinkirchner J., Gosele U. The crack opening method in silicon wafer bonding. How useful is it? J Electrochem Soc. 144(1):1997;354.
-
(1997)
J Electrochem Soc
, vol.144
, Issue.1
, pp. 354
-
-
Martini, T.1
Steinkirchner, J.2
Gosele, U.3
-
15
-
-
0344115256
-
Silicone wafer bonding mechanism for silicon-on-insulator structures
-
Abe T., Takei T., Uchiyama A., Yoshizawa K., Nakazato Y. Silicone wafer bonding mechanism for silicon-on-insulator structures. Jpn J Appl Phys. 29(12):1990;L2311.
-
(1990)
Jpn J Appl Phys
, vol.29
, Issue.12
, pp. 2311
-
-
Abe, T.1
Takei, T.2
Uchiyama, A.3
Yoshizawa, K.4
Nakazato, Y.5
|