Large aperture compound lenses made of lithium

Review of Scientific Instruments

Volumn 74, Issue 4, 2003, Pages 2262-2266

  Cremer, J T ^a   Piestrup, M A ^a   Beguiristain, H R ^a   Gary, C K ^a   Pantell, R H ^b  

^a ADELPHI TECHNOLOGY INC   (United States)

^b Stanford University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FOCUSING; GAIN MEASUREMENT; LIGHT REFRACTION; LITHIUM; PHOTONS; X RAYS;

COMPOUND REFRACTIVE LENSES (CRL);

OPTICAL INSTRUMENT LENSES;

EID: 0038680425     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1556948     Document Type: Article

References (27)

1. T. Tomie, Japan Patent No. 6-045288 (1994).
2. T. Tomie, U.S. Patent No. 5,594,773 (1997).
3. T. Tomie, U.S. Patent No. 5,684,852 (1997).
4. A. Snigirev, V. Kohn, I. Snigireva, and B. Lengeler, Nature (London) 384, 49 (1996).
5. B. X. Yang, Nucl. Instrum. Methods Phys. Res. A 328, 578 (1993).
6. R. K. Smither, A. M. Khounsary, and S. Xu, Proc. SPIE 3151, 150 (1997).
7. A. Snigirev, B. Filseth, P. Elleaume, Th. Klocke, V. Kohn, B. Lengeler, I. Snigireva, A. Souvorov, and J. Tümmeler, Proc. SPIE 3151, 164 (1997).
8. B. Lengeler, J. Tümmeler, A. Snigirev, I. Snigireva, and C. Raven, J. Appl. Phys. 84, 5855 (1998).
9. B. Lengeler, C. G. Schroer, M. Richwin, J. Tümmeler, M. Drakopolulos, A. Snigirev, and I. Snigireva, Appl. Phys. Lett. 74, 3924 (1999).
10. J. T. Cremer, M. A. Piestrup, H. R. Beguiristain, C. K. Gary, R. H. Pantell, and R. Tatchyn, Rev. Sci. Instrum. 70, 3545 (1999).
11. H. R. Beguiristain, M. A. Piestrup, R. H. Pantell, C. K. Gary, and J. T. Cremer, Proceedings of the 11th Synch. Rad. Instr. Conference (2000), Vol. 521, pp. 258-266.
12. H. R. Beguiristain, J. T. Cremer, M. A. Piestrup, R. H. Pantell, C. K. Gary, and J. Feinstein, Proc. SPIE 4144, 155 (2000).
13. M. A. Piestrup, R. H. Pantell, J. T. Cremer, and H. R. Beguiristain, U.S. Patent No. 6,269,145(2001).
14. R. H. Pantell, J. Feinstein, M. A. Piestrup, H. R. Beguiristain, C. K. Gary, and J. T. Cremer, Rev. Sci. Instrum. 72, 48 (2001).
15. M. A. Piestrup, H. R. Beguiristain, C. K. Gary, J. T. Cremer, and R. H. Pantell, Rev. Sci. Instrum. 71, 4375 (2000).
16. H. R. Beguiristain, J. T. Cremer, M. A. Piestrup, C. K. Gary, and R. H. Pantell, Opt. Lett. 27, 778 (2002).
17. N. R. Pereira, D. A. Arms, R. Clarke, S. B. Dierker, E. Dufresne, and D. Foster, Proc. SPIE 4502, 173 (2001).
18. E. M. Dufresne, D. A. Arms, R. Clarke, N. R. Pereira, S. B. Dierker, and D. Foster, Appl. Phys. Lett. 79, 4085 (2001).
19. D. A. Arms, E. M. Dufresne, R. Clarke, S. B. Dierker, N. R. Pereira, and D. Foster, Rev. Sci. Instrum. 73, 1492 (2002).
20. B. Cederström, R. Cahn, M. Danielsson, M. Lundqvist, and D. Nygren, Nature (London) 404, 951 (2000).
21. C. T. Chantler, K. Olsen, and D. S. Zucker (1999). X-Ray Form Factor, Attenuation and Scattering Tables (version 2.0) [2002, November 21]. (National Institute of Standards and Technology, Gaithersburg, MD, 2002), available: http://physics.nist.gov/ffast
22. E. M. Gullickson, X-ray Data Booklet, Center for X-Ray Optics and Advanced Light Source (2001), p. 144.
23. F. L. Pedrotti and L. Pedrotti, Introduction to Optics (Prentice-Hall, Englewood Cliffs, NJ, 1987), Chap. 3, p. 60.
24. H. Tompkins (private communication).
25. R. H. Pantell (unpublished).
26. M. A. Piestrup, H. R. Beguiristain, C. K. Gary, J. T. Cremer, R. H. Pantell, and R. Tatchyn, Nucl. Instrum. Methods Phys. Res. B 173, 170 (2001).
27. B. Cederström, R. N. Cahn, M. Danielsson, M. Lundqvist, and D. R. Nygren, Proc. SPIE 3659, 407 (1999).