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Volumn 426-432, Issue 4, 2003, Pages 3487-3492

Near-zero-thickness self-assembled molecular layers for future device structures: Interfacial adhesion and diffusion barrier properties

(5) Ganesan, P G a Cui, G a Ellis, A V a Kane, R S a Ramanath, G a

a RENSSELAER POLYTECHNIC INSTITUTE (United States)

Author keywords

Diffusion barriers; Interfacial adhesion; Self assembled molecular layers

Indexed keywords

ADHESION; ASPECT RATIO; DIFFUSION; ELECTRON SPECTROSCOPY; POLYELECTROLYTES;

INTERFACIAL ADHESION;

SELF ASSEMBLY;

EID: 0038676231 PISSN: 02555476 EISSN: 16629752 Source Type: Book Series
DOI: 10.4028/www.scientific.net/msf.426-432.3487 Document Type: Conference Paper

Times cited : (5)

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