Structural and optical properties of epitaxial BaTiO3 thin films grown on GdScO3(110)

Applied Physics Letters

Volumn 82, Issue 20, 2003, Pages 3460-3462

  Schubert, J ^a   Trithaveesak, O ^a   Petraru, A ^a   Jia, C L ^a   Uecker, R ^b   Reiche, P ^b   Schlom, D G ^c  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b LEIBNIZ INSTITUTE FOR CRYSTAL GROWTH   (Germany)

^c PENNSYLVANIA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EPITAXIAL GROWTH; FILM GROWTH; GADOLINIUM COMPOUNDS; HIGH RESOLUTION ELECTRON MICROSCOPY; INTERFACES (MATERIALS); PULSED LASER DEPOSITION; REFRACTIVE INDEX;

SURFACE SEGREGATION;

THIN FILMS;

EID: 0038657926     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1575935     Document Type: Article

References (16)

1. A. Petraru, J. Schubert, M. Schmid, and Ch. Buchal, Appl. Phys. Lett. 81, 1375 (2002).
2. Y. Yan, M. F. Chisholm, S. J. Pennycook, and S. T. Pantelidis, Surf. Sci. 442, 251 (1999).
3. R. Souda, Y. Hwang, T. Aizawa, W. Hayami, K. Oyoshi, and S. Hishita, Surf. Sci. 387, 136 (1997).
4. J. M. Phillips, J. Appl. Phys. 79, 1829 (1996).
5. H.-M. Christen, L. A. Boatner, J. D. Budai, M. F. Chisholm, L. A. Gea, D. P. Norton, Ch. Gerber, and M. Urbanik, Appl. Phys. Lett. 70, 2147 (1997).
6. M. Siegert, J. G. Lisoni, C. H. Lei, A. Eckau, W. Zander, C. L. Jia, J. Schubert, and Ch. Buchal, Mater. Res. Soc. Symp. Proc. 597, 145 (2000).
7. J. Schubert, M. Siegert, M. Fardmanesh, W. Zander, M. Prömpers, Ch. Buchal, J. Lisoni, and C. H. Lei, Appl. Surf. Sci. 168, 208 (2000).
8. S. N. Amanyan, P. A. Arsen'ev, Kh. S. Bagdasarov, A. M. Kevorkov, D. I. Korolev, A. V. Potemkin, and V. V. Femin, J. Appl. Spectrosc. 38, 343 (1983).
9. S. Geller, Acta Crystallogr. 10, 243 (1957).
10. Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology, New Series, Group III Vol. 7e, edited by K.-H. Hellwege and A. M. Hellwege (Springer, Berlin, 1976), pp. 10-13.
11. 3 single crystal substrates are available through Crys-Tec GmbH, Köpenicker Str. 325, 12555 Berlin, Germany.
12. L. Seekers, J. Schubert, W. Zander, J. Ziesmann, A. Eckau, P. Leinenbach, and Ch. Buchal, J. Appl. Phys. 83, 3305 (1998).
13. R. Ulrich and R. Torge, Appl. Opt. 12, 2901 (1973).
14. T. Zhao, P. Chen, H. Lu, G. Yang, and Z. Chen, J. Appl. Phys. 87, 7442 (2000).
15. M. D. Biegalski, J. H. Haeni, C. D. Brandle, A. Ven Graitis, S. Trolier-McKinstry and D. G. Schlom, presented at the 9th International Workshop of Oxide Electronics, St. Pete Beach, FL, 2002 (unpublished).
16. C. L. Jia, M. Siegert, and K. Urban, Acta Mater. 49, 2783 (2001).