Anomalous surface diffusion in nanoscale direct deposition processes

Physical Review Letters

Volumn 90, Issue 11, 2003, Pages

  Manandhar, P ^a   Jang, J ^b   Schatz, G C ^b   Ratner, M A ^b   Hong, S ^a  

^a FLORIDA STATE UNIVERSITY   (United States)

^b NORTHWESTERN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BINDING ENERGY; DEPOSITION; DIFFUSION; LITHOGRAPHY; MOLECULAR DYNAMICS; SURFACE PHENOMENA; SURFACES;

DIP PEN NANOLITHOGRAPHY; MOLECULAR INK; NANOSCALE DEPOSITION PROCESSES; SURFACE DIFFUSION;

NANOSTRUCTURED MATERIALS;

EID: 0038643163     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (25)

1. T. Michely et al., Phys. Rev. Lett. 70, 3943 (1993)
2. S. M. Oh et al., Phys. Rev. Lett. 88, 236102 (2002).
3. E. Delamarche et al., J. Phys. Chem. B 102, 3324 (1998)
4. M. Jaschke and H. J. Butt, Langmuir 11, 1061 (1995)
5. S. Xu, P. E. Laibinis, and G. Y. Liu, J. Am. Chem. Soc. 120, 9356 (1998)
6. V. Schmitt and F. Lequeux, Langmuir 14, 283 (1998).
7. R. Piner et al., Science 283, 661 (1999)
8. S. Hong et al., Science 286, 523 (1999)
9. D. Weinberger et al., Adv. Mater. 12, 1600 (2000)
10. D. L. Wilson et al., Proc. Natl. Acad. Sci. U.S.A. 98, 13660 (2001)
11. M. Zhang et al., Nanotechnology 13, 212 (2002)
12. S. Rozhok et al., J. Phys. Chem. B 107, 751 (2003).
13. J. Jang et al., J. Chem. Phys. 115, 2721 (2001).
14. P. E. Sheehan and L. J. Whitman, Phys. Rev. Lett. 88, 156104 (2002).
15. B. L. Weeks et al., Phys. Rev. Lett. 88, 255505 (2002).
16. The CP AFM (Digital Instruments) equipped with a close loop scanner and the DPN software (NanoInk) is placed in the glove box for the humidity control. The temperature is controlled by the resistive heaters attached on the AFM tip (Microlevel A, Digital Instruments) and sample holders. The humidity and temperature for the experiments are 55% and 29 °C, respectively.
17. C. W. Zhou et al., Science 290, 1552 (2000).
18. H. A. Biebuyck and G. M. Whitesides, Langmuir 10, 4581 (1994)
19. Y. Xia and G. M. Whitesides, J. Am. Chem. Soc. 117, 3274 (1995).
20. J. Jang, G. C. Schatz, and M. A. Ratner, J. Chem. Phys. 116, 3875 (2002).
21. T. A. Witten, Jr. and L. M. Sander, Phys. Rev. Lett. 47, 1400 (1981).
22. P. Meakin, Phys. Rev. Lett. 51, 1119 (1983).
23. P. Meakin, Phys. Rev. A 27, 1495 (1983).
24. See EPAPS Document No. E-PRLTAO-90-004309 for AFM microscopy images of bulk deposited 1-dodecylamine crystalline film and DPN-generated ODT patterns on mica surfaces. A cirect link to this document may be found in the online article's HTML reference section. The document may also be reached via the EPAPS homepage (http://www.aip.org/pubservs/epaps.html) or from ftp.aip.org in the directory/epeps/. See the EPAPS homepage for more information.
25. R. M. Haralick, IEEE Trans. Syst. Man. Cybern. 4, 394 (1974).