Growth of beryllium nitride films by pulsed laser deposition; dielectric function determination

Thin Solid Films

Volumn 434, Issue 1-2, 2003, Pages 7-13

  Soto, G ^a   Machorro, R ^a   Diaz J A ^a   De la Cruz, W ^a   Reyes, A ^a  

^a UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Beryllium nitride; Ellipsometry; Optical properties; Optoelectronic films

Indexed keywords

ATOMIC FORCE MICROSCOPY; BERYLLIUM COMPOUNDS; ELECTRON SPECTROSCOPY; ELLIPSOMETRY; OPTOELECTRONIC DEVICES; PHOTONS; PULSED LASER DEPOSITION; SCANNING ELECTRON MICROSCOPY;

PHOTON-ENERGY RANGE;

THIN FILMS;

EID: 0038615928     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(03)00534-0     Document Type: Article

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