On the problem of overlapping ω scans measured on thin films deposited on monocrystal substrates

Journal of Applied Crystallography

Volumn 32, Issue 4, 1999, Pages 736-743

  MacHajdik D ^a   Pevala, A ^a   Rosova A ^a   Frohlich K ^a   Souc J ^a   Weiss, F ^b   Figueras, A ^c  

^a INSTITUTE OF CHEMISTRY   (Slovakia)

^b Grenoble INP Phelma   (France)

^c INSTITUT DE CIÈNCIA DE MATERIALS DE BARCELONA ICMAB CSIC   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0038567115     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/s0021889899004380     Document Type: Article

References (4)

1. Becht, M., Wang, F., Wen, J. G. & Morishita, T. (1997). J. Cryst. Growth, 170, 799-802.
2. Castel, X., Guilloux-Viry, M., Perrin, A., Lesueur, J. & Lalu, F. (1998). J. Cryst. Growth, 187, 211-220.
3. Fröhlich, K., Šouc, J., Machajdík, D., Kobzev, A. P., Weiss, F., Senateur, J. P. & Dahmen, K. H. (1995). J. Phys. IV Colloq. C5, 5, C5-533-C5-539.
4. Zaitsev, A. G., Ockenfuss, G, Guggi, D. & Wördenweber, R. (1997). J. Appl. Phys. 81, 3069-3072.