Renormalized ellipsometry for determining the anisotropic refractive indices of nematic liquid crystals

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 42, Issue 2 A, 2003, Pages 486-491

  Tanaka, Norihiko ^a   Kimura, Mumehiro ^a   Akahane, Tadashi ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

Author keywords

Birefringence; Ellipsometry; Nematic liquid crystal; Refractive index

Indexed keywords

ANISOTROPY; BIREFRINGENCE; CRYSTAL ORIENTATION; ELLIPSOMETRY; ENERGY GAP; MATRIX ALGEBRA; REFRACTIVE INDEX;

CELL GAP; RENORMALIZED TRANSMISSION ELLIPSOMETRY;

NEMATIC LIQUID CRYSTALS;

EID: 0038564302     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.486     Document Type: Article

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