Analysis of totally reflected light from liquid crystal cell using renormalized ellipsometry

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 40, Issue 5 A, 2001, Pages 3288-3293

  Okutani, Satoshi ^a   Kimura, Munehiro ^a   Toriumi, Hirokazu ^b   Akao, Ken Ichi ^c   Tadokoro, Toshiyasu ^c   Akahane, Tadashi ^a  

^a NAGAOKA UNIVERSITY OF TECHNOLOGY   (Japan)

^b UNIVERSITY OF TOKYO   (Japan)

^c Hachioji shi   (Japan)

Author keywords

Generalized ellipsometry; Interface; Liquid crystal; Optical anisotropy; Renormalized ellipsometry; Total reflection

Indexed keywords

ANISOTROPY; ELECTRIC FIELD EFFECTS; ELLIPSOMETRY; LIGHT REFLECTION; MATRIX ALGEBRA; VECTORS;

OPTICAL ANISOTROPY;

LIQUID CRYSTALS;

EID: 0035328561     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.40.3288     Document Type: Article

References (6)