Role of interface suboxide Si atoms on the electronic properties of Si/SiO 2 superlattices

Applied Surface Science

Volumn 212-213, Issue SPEC., 2003, Pages 826-828

  Carrier, P ^a   Lu, Z H ^b   Lewis, L J ^a   Dharma Wardana, M W C ^c  

^a UNIVERSITÉ DE MONTRÉAL   (Canada)

^b UNIVERSITY OF TORONTO   (Canada)

^c NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

Electronic properties; Low dimensional systems; Optical properties; Quantum wells; Silicon; Silicon dioxide

Indexed keywords

INTERFACES (MATERIALS); SEMICONDUCTOR QUANTUM WELLS; SUPERLATTICES; THIN FILMS;

LOW DIMENSIONAL SYSTEMS;

SILICA;

EID: 0038548381     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(03)00076-X     Document Type: Conference Paper

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