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Volumn 742, Issue , 2002, Pages 47-58
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3C-SiC monocrystals grown on undulant Si(001) substrates
a a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
ANISOTROPY;
EPITAXIAL GROWTH;
MONOLAYERS;
SUBSTRATES;
X RAY DIFFRACTION ANALYSIS;
ANTI-PHASE BOUNDARIES;
SILICON CARBIDE;
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EID: 0038518579
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1557/proc-742-k1.6 Document Type: Conference Paper |
Times cited : (8)
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References (15)
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