New method for parameter extraction in deep submicrometer MOSFETs

IEEE International Conference on Microelectronic Test Structures

Volumn , Issue , 2000, Pages 181-186

  Mourrain, C ^a   Cretu, B ^a   Ghibaudo, G ^a   Cottin, P ^a  

^a ORANGE LABS   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER MOBILITY; ELECTRIC CURRENTS; ELECTRONICS INDUSTRY; INTEGRATED CIRCUIT TESTING; MICROELECTRONICS; PARAMETER ESTIMATION;

DEEP SUBMICROMETER; PARAMETER EXTRACTION; SECOND ORDER MOBILITY ATTENUATION;

MOSFET DEVICES;

EID: 0033708188     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (7)