An X-ray diffractometer for accurate structural invariant phase determination

Journal of Synchrotron Radiation

Volumn 10, Issue 3, 2003, Pages 236-241

  Morelhão, Sérgio L ^a  

^a UNIVERSITY OF SÃO PAULO   (Brazil)

Author keywords

Linear polarization; Reflection phase determination; Single crystals; Three beam X ray diffraction

Indexed keywords

DATA ACQUISITION; DIFFRACTOMETERS; LIGHT POLARIZATION; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

X-RAY DIFFRACTOMETERS;

SINGLE CRYSTALS;

EID: 0038476323     PISSN: 09090495     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0909049503003789     Document Type: Article

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