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Volumn 89, Issue 1, 2002, Pages 155011-155014
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Enhanced x-ray phase determination by three-beam diffraction
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Author keywords
[No Author keywords available]
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Indexed keywords
APPROXIMATION THEORY;
ATTENUATION;
CRYSTAL DEFECTS;
GONIOMETERS;
KINEMATICS;
LIGHT INTERFERENCE;
LIGHT POLARIZATION;
LIGHT REFLECTION;
MONOCHROMATORS;
RESONANCE;
SEMICONDUCTING SILICON;
SINGLE CRYSTALS;
SYNCHROTRON RADIATION;
PHASE DETERMINATION;
X RAY DIFFRACTION;
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EID: 0036641513
PISSN: 00319007
EISSN: None
Source Type: Journal
DOI: 10.1103/PhysRevLett.89.015501 Document Type: Article |
Times cited : (22)
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References (22)
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