Correlation between microstructural and electroluminescent properties of Ge-SiO2 composite films

Materials Science and Engineering: B

Volumn 100, Issue 2, 2003, Pages 152-155

  Lu, M J ^a,b   Wu, X M ^a,b   Yao, W G ^a,b  

^a SOOCHOW UNIVERSITY   (China)

^b SHANGHAI INSTITUTE OF MICROSYSTEM AND INFORMATION TECHNOLOGY   (China)

Author keywords

Electroluminescence; Ge SiO2; Structure

Indexed keywords

ANNEALING; COMPOSITE MATERIALS; ELECTROLUMINESCENCE; MAGNETRON SPUTTERING; MICROSTRUCTURE; NANOSTRUCTURED MATERIALS; NITROGEN; SILICA; THIN FILMS; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

QUANTUM CONFINEMENT (QC) EFFECTS;

GERMANIUM;

EID: 0038452460     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-5107(03)00090-4     Document Type: Article

References (18)

1. Canham L.T. Appl. Phys. Lett. 57:1990;1046.
2. Colvin V.L., Schlamp M.C., Alivisatos A.P. Nature. 370:1994;354.
3. Rebohle L., von Borany J., Skorupa W., Tyschenko I.E., Fröb H. J. Lumin. 80:1999;275.
4. Qin G.G., Bai G.F., Li A.P., Ma S.Y., Sun Y.K., Zhang B.R., Ma Z.C., Zong W.H. Thin Solid Films. 338:1999;131.
5. B. Garrido, M. López, O. González, A. Pérez-Rodríguez, J.R. Morante, C. Bonafos, 77 (2000) 3143.
6. Delerue C., Allan G., Lannoo M. Phys. Rev. B48:1993;11024.
7. Takagahara T., Takeda K. Phys. Rev. B46:1992;15578.
8. Wang L.W., Zunger A. J. Phys. Chem. 98:1994;2158.
9. Cullis A.G., Conham L.T., Calcott P.D.J. J. Appl. Phys. 82:1997;909.
10. Qin G.G., Heng C.L., Bai C.F., Wu K., Li C.Y., Ma Z.C., Zong H., Yon L.-P. Appl. Phys. Lett. 75:1999;3629.
11. Kanemiutsu Y., Okamoto S. Phys. Rev. B56:1997;R1696.
12. Wolkin M.V., Jorne J., Fauchet P.M., Allan G., Delerue C. Phys. Rev. Lett. 82:1999;197.
13. Withrow S.P., White C.W., Meldrum A., Budai J.D., Hembree D.M., Harbour J.C. J. Appl. Phys. 86:1999;396.
14. Muillenberg G.E. Handbook of X-ray Photoelectron Spectroscopy. 1978;Perkin-Elmer, Eden Prairie, MN.
15. Shalvoy P.R. Phys. Rev. B15:1977;1680.
16. Ting G., Xi-mao B., Feng Y., Song T., Yi-jun C. Acta Phys. Sin. 6:1997;466.
17. Wang Y.G., Zhao T.P., Liu J., Qin G.G. Appl. Phys. Lett. 74:1999;3815.
18. Yuan J., Haneman D. J. Appl. Phys. 86:1999;2358.