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Volumn 74, Issue 25, 1999, Pages 3815-3817

Near-ultraviolet and near-infrared electroluminescence from an indium-tin-oxide film/native Si oxide/p-Si structure

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; CRYSTAL ORIENTATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTROLUMINESCENCE; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTING SILICON; SUBSTRATES;

EID: 0032606314     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124189     Document Type: Article
Times cited : (21)

References (9)
  • 5
    • 0001753504 scopus 로고    scopus 로고
    • edited by L. Canham Inspect, London
    • A. G. Cullis, L. T. Canham, and P. D. J. Calcott, J. Appl. Phys. 82, 909 (1997); Properties of Porous Silicon, edited by L. Canham (Inspect, London, 1997).
    • (1997) Properties of Porous Silicon


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.