Atomic force microscopy measurement of cytostructural elements involved in the nanodynamics of tumour cell invasion

Nanotechnology

Volumn 14, Issue 5, 2003, Pages 557-561

  Chasiotis, I ^a   Fillmore, H L ^b   Gillies, G T ^a,b  

^a University of Virginia   (United States)

^b VIRGINIA COMMONWEALTH UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; BRAIN; CELLS; CYTOLOGY; SUBSTRATES; TORQUE MEASUREMENT; TUMORS;

EXTRACELLULAR MATRIX (ECM);

NANOTECHNOLOGY;

EID: 0038444006     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/14/5/314     Document Type: Article

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