Primary electronic thermometry using the shot noise of a tunnel junction

Science

Volumn 300, Issue 5627, 2003, Pages 1929-1932

  Spietz, Lafe ^a   Lehnert, K W ^a,b   Siddiqi, I ^a   Schoelkopf, R J ^a  

^a Yale University   (United States)

^b UNIVERSITY OF COLORADO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC POTENTIAL; SHOT NOISE; SIGNAL NOISE MEASUREMENT; TUNNEL JUNCTIONS;

CRYOGENIC SYSTEMS;

THERMOMETERS;

ELECTRICAL PROPERTY; ELECTRON; NOISE;

ACCURACY; ARTICLE; CRYOBIOLOGY; ELECTRON; NOISE; PRIORITY JOURNAL; TEMPERATURE; THERMODYNAMICS; THERMOMETER; THERMOMETRY;

EID: 0038409935     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.1084647     Document Type: Article

References (41)

1. R. L. Rusby et al., Metrologia 33, 409 (1996).
2. M. R. Moldover et al., Phys. Rev. Lett. 60, 249 (1988).
3. H. L. Callendar, Philos. Mag. 48, 519 (1899).
4. B. N. Taylor, T. J. Witt, Metrologia 26, 47 (1989).
5. J. P. Pekola, K. P. Hirvi, J. P. Kauppinen, M. A. Paalanen, Phys. Rev. Lett. 73, 2903 (1994).
6. J. P. Kauppinen, K. T. Loberg, A. J. Manninen, J. P. Pekola, Rev. Sci. Instr. 69, 4166 (1998).
7. P. Delsing et al., Physica B 194, 27 (1994).
8. A. J. Manninen et al., Physica B 284-288, 2010 (2000).
9. J. P. Pekola et al., J. Low Temp. Phys. 128, 263 (2002).
10. D. R. White et al., Metrologia 33, 325 (1996).
11. J. B. Johnson, Nature 119, 50 (1927).
12. J. B. Johnson, Phys. Rev. 32, 97 (1928).
13. H. Nyquist, Phys. Rev. 32, 110 (1928).
14. D. R. White, E. Zimmermann, Metrologia 37, 11 (2000).
15. R. H. Dicke, Rev. Sci. Instrum. 17, 268 (1946).
16. R. A. Webb, R. P. Giffard, J. C. Wheatley, J. Low Temp. Phys. 13, 383 (1973).
17. C. P. Lusher et al., Meas. Sci. Technol. 12, 1 (2001).
18. R. A. Kamper, J. E. Zimmerman J. Appl. Phys. 42, 132 (1971).
19. R. J. Soulen Jr., W. E. Fogle, J. J. Colwell, J. Low Temp. Phys. 94, 385 (1994).
20. S. P. Benz, J. M. Martinis, S. W. Nam, W. L. Tew, D. R. White, in the Proceedings of Tempmeko 2001 (www.cstl.nist.gov/div836/836.05/papers/Tempmeko_01_JNT.pdf).
21. W. Schottky, Ann. Phys. 57, 541 (1918).
22. T. Van Duzer, C. W. Turner, Principles of Superconductive Devices and Circuits (Elsevier North Holland, New York, 1981), pp. 75-78.
23. R. A. Pucel, Proc. IRE 49, 1080 (correspondence) (1961).
24. A. J. Dahm et al., Phys. Rev. Lett. 22, 1416 (1969).
25. D. Rogovin, D. J. Scalpino, Ann. Phys. 86, 1 (1974).
26. H. B. Callen, T. A. Welton, Phys. Rev. 83, 34 (1951).
27. 1 = 2e//3 (37), the temperature extracted is the same.
28. J. Niemeyer, PTB-Mitt. 84, 251 (1974).
29. G. J. Dolan, Appl. Phys. Lett. 31, 337 (1977).
30. S. K. Tolpygo et al., IEEE Trans. Appl. Supercond., in press.
31. We used a rhodium-iron resistance thermometer (RF800-4-1.4L, Lakeshore Cryotronics, Westerville, OH, www.lakeshore.com) and a ruthenium-oxide resistance thermometer (RX202A-AA, Lakeshore Cryotronics).
32. J. P. Kauppinen, J. Pekola, Phys. Rev. B 54, R8353 (1996).
33. L Page, D. Wilkinson, Rev. Mod. Phys. 71, S173 (1999).
34. J. D. Kraus Radio Astronomy (Cygnus-Quasar Books, Powell, OH, 1986), pp. 7-16.
35. At low temperatures, we assume diffusion cooling and use the Wiedemann-Franz law to compute the heating due to the finite lead resistance. Because the thermal conductance is proportional to temperature and the maximum power dissipated scales with temperature squared, the fractional temperature error is constant with temperature.
36. J. P. Kauppinen, J. P. Pekola, Phys. Rev. Lett. 77, 3889 (1996).
37. R. J. Schoelkopf et al., Phys. Rev. Lett. 78, 3370 (1997).
38. P. J. Mohr, B. N. Taylor, J. Phys. Chem. Ref. Data 28, 1713 (1999).
39. H. Preston-Thomas, Metrologia 27, 3 (1990).
40. ITS-90 is the international temperature scale of 1990 and PLTS-2000 is the provisional low-temperature scale of 2000.
41. We thank M. Devoret, B. Jarvis, K. Likharev, D. Prober, and W. Tew for useful discussions and the David and Lucile Packard Foundation for support.