-
1
-
-
30244555061
-
ISAAC - Integrated silicon automotive accelerometer
-
L.J. Sprangler, and C. Kemp, "ISAAC - Integrated Silicon Automotive Accelerometer", Sensors and Actuators A, Vol. 54, pp. 523-529, 1995.
-
(1995)
Sensors and Actuators A
, vol.54
, pp. 523-529
-
-
Sprangler, L.J.1
Kemp, C.2
-
2
-
-
0027084126
-
Anodic bonding of integrated capacitive sensors
-
Travemunde, Germany
-
M. Esashi, N. Ura, and Y. Matsumoto, "Anodic Bonding of Integrated Capacitive Sensors," MEMS 1992, Proc. IEEE Fifth Ann. Intl. Workshop Micro Electro Mechanical Systems, Travemunde, Germany, pp. 43-48, 1992.
-
(1992)
MEMS 1992, Proc. IEEE Fifth Ann. Intl. Workshop Micro Electro Mechanical Systems
, pp. 43-48
-
-
Esashi, M.1
Ura, N.2
Matsumoto, Y.3
-
3
-
-
0031220946
-
Design of a modular micropump based on anodic bonding
-
M. Acero, J. Plaza, J. Esteve, M. Carmona, S. Macro, and J. Samatier, "Design of a Modular Micropump Based on Anodic Bonding", J. Micromech. Microeng., Vol. 7, pp. 179-182, 1997.
-
(1997)
J. Micromech. Microeng.
, vol.7
, pp. 179-182
-
-
Acero, M.1
Plaza, J.2
Esteve, J.3
Carmona, M.4
Macro, S.5
Samatier, J.6
-
5
-
-
0029770936
-
Anodically bonded silicon membranes for sealed and flush mounted microsensors
-
San Diego, CA
-
S.F. Trautweiler, O. Paul, J. Stahl, and H. Baltes, "Anodically Bonded Silicon Membranes For Sealed and Flush Mounted Microsensors", MEMS 1996, Proc. IEEE Ninth Ann. Intl. Workshop Micro Electro Mechanical Systems, San Diego, CA, pp. 61-66, 1996.
-
(1996)
MEMS 1996, Proc. IEEE Ninth Ann. Intl. Workshop Micro Electro Mechanical Systems
, pp. 61-66
-
-
Trautweiler, S.F.1
Paul, O.2
Stahl, J.3
Baltes, H.4
-
6
-
-
0032136370
-
Wafer to wafer bonding for microstructure formation
-
August
-
M.A. Schmidt, "Wafer to wafer bonding for Microstructure Formation", Proceedings of the IEEE, Vol. 86(8), pp. 1575-1585, August 1998.
-
(1998)
Proceedings of the IEEE
, vol.86
, Issue.8
, pp. 1575-1585
-
-
Schmidt, M.A.1
-
7
-
-
0026003541
-
Silicon-on-insulator by wafer bonding: A review
-
Jan
-
W.P. Maszara, "Silicon-on-insulator by Wafer Bonding: A Review", J. Electrochem. Soc. Vol. 138 (1), p. 341, Jan 1991.
-
(1991)
J. Electrochem. Soc.
, vol.138
, Issue.1
, pp. 341
-
-
Maszara, W.P.1
-
9
-
-
0024717407
-
Silicon-on-insulator wafer bonding-wafer thinning technological evaluations
-
Aug.
-
J. Haisma, G.A.C.M. Spierings, U.K.P. Biermann, and J.A. Pals, "Silicon-on-insulator wafer bonding-wafer thinning technological evaluations ", Jpn. J. of App. Phys., Vol. 28 (8), p. 1426, Aug. 1989.
-
(1989)
Jpn. J. of App. Phys.
, vol.28
, Issue.8
, pp. 1426
-
-
Haisma, J.1
Spierings, G.A.C.M.2
Biermann, U.K.P.3
Pals, J.A.4
-
10
-
-
0026900505
-
Semiconductor wafer bonding: A review of interfacial properties and applications
-
Aug.
-
S. Bengtsson, "Semiconductor Wafer Bonding: A review of interfacial properties and applications", J. Electronic Materials, Vol. 21 (8), p.841, Aug. 1992.
-
(1992)
J. Electronic Materials
, vol.21
, Issue.8
, pp. 841
-
-
Bengtsson, S.1
-
11
-
-
0022238888
-
Bonding techniques for microsensors
-
Amsterdam: The Netherlands, Elsevier
-
W.H. Ko, J.T. Suminto, and G.J. Yeh, "Bonding Techniques for Microsensors", Micromachining and Micro packaging of Transducers, Amsterdam: The Netherlands, Elsevier, p. 41, 1985.
-
(1985)
Micromachining and Micro Packaging of Transducers
, pp. 41
-
-
Ko, W.H.1
Suminto, J.T.2
Yeh, G.J.3
-
12
-
-
0014563672
-
Filed assisted glass metal sealing
-
G. Wallis, and D.I. Pomerantz, "Filed Assisted Glass Metal Sealing", J. Appl. Phys., Vol. 40 (10), p. 3946, 1969.
-
(1969)
J. Appl. Phys.
, vol.40
, Issue.10
, pp. 3946
-
-
Wallis, G.1
Pomerantz, D.I.2
-
13
-
-
0020750966
-
Anodic bonding of imperfect surfaces
-
T.R. Anthony, "Anodic Bonding of Imperfect Surfaces", J. Appl. Phys., Vol. 54 (5), p. 2419, 1983.
-
(1983)
J. Appl. Phys.
, vol.54
, Issue.5
, pp. 2419
-
-
Anthony, T.R.1
-
14
-
-
0025419816
-
The mechanism of field-assisted silicon-glass bonding
-
Y. Kanda, K. Matsuda, C. Murayama, and J. Sugaya, "The Mechanism of Field-Assisted Silicon-Glass Bonding", Sensors and Actuators, Vol. A21-A23, p. 939, 1990.
-
(1990)
Sensors and Actuators
, vol.A21-A23
, pp. 939
-
-
Kanda, Y.1
Matsuda, K.2
Murayama, C.3
Sugaya, J.4
-
15
-
-
0029234140
-
Selection of glass, anodic bonding conditions, and material compatibility for silicon glass capacitive sensors
-
T. Rogers, J. Kowal, "Selection of glass, anodic bonding conditions, and material compatibility for silicon glass capacitive sensors", Sensors and Actuators, Vol. A46-A7, p.113, 1995.
-
(1995)
Sensors and Actuators
, vol.A46-A7
, pp. 113
-
-
Rogers, T.1
Kowal, J.2
-
16
-
-
0028429727
-
Low temperature silicon wafer-to-wafer bonding using gold at eutectic temperature
-
R.F. Wolffenbuttel, and K.D. Wise, "Low temperature silicon wafer-to-wafer bonding using gold at eutectic temperature", Sensors and Actuators, Vol. A43, p. 223, 1994.
-
(1994)
Sensors and Actuators
, vol.A43
, pp. 223
-
-
Wolffenbuttel, R.F.1
Wise, K.D.2
-
17
-
-
0030659231
-
Batch transfer of microstructures using flip chip solder bump bonding
-
Chicago, IL, June
-
th Intl. Conf. Solid-State Sensors and Actuators, Chicago, IL, p. 265, June 1997.
-
(1997)
th Intl. Conf. Solid-State Sensors and Actuators
, pp. 265
-
-
Singh, A.1
Horsley, D.A.2
Cohn, M.B.3
Pisano, A.P.4
Howe, R.T.5
-
18
-
-
0029376453
-
Sacrificial wafer bonding for planarization after very deep etching
-
V.I. Spiering, J.W. Berenschot, M. Elwenpoek, and J.H. Fluitman, "Sacrificial Wafer Bonding for Planarization after very deep etching", J. Microelectromech. Syst., Vol. 4(3), p. 151, 1995.
-
(1995)
J. Microelectromech. Syst.
, vol.4
, Issue.3
, pp. 151
-
-
Spiering, V.I.1
Berenschot, J.W.2
Elwenpoek, M.3
Fluitman, J.H.4
-
19
-
-
0038064679
-
Sealed-cavity microstructure using wafer bonding technology
-
Yokohoma, Japan, June
-
th Intl. Conf. Solid-State Sensors and Actuators, Yokohoma, Japan, pp. 274-277, June 1993.
-
(1993)
th Intl. Conf. Solid-State Sensors and Actuators
, pp. 274-277
-
-
Parameswaran, L.1
McNeil, V.M.2
Huff, M.A.3
Schmidt, M.A.4
-
20
-
-
0030679113
-
A new method to fabricate metal tips for scanning probe microscopy
-
Nagoya, Japan
-
th Annual Workshop MEMS, Nagoya, Japan, p. 129, 1997.
-
(1997)
th Annual Workshop MEMS
, pp. 129
-
-
Yagi, T.1
Shimada, Y.2
Ikeda, T.3
Takamatsu, O.4
Matsuda, H.5
Takimoto, K.6
Hirai, Y.7
-
21
-
-
0036807141
-
Novel flip-chip bonding technology for W-band interconnections using alternate lead free solder bumps
-
Oct.
-
K.O. Nodera, T. Ishii, S. Aoyama, S. Sugitami, and M. Tokumitsu, "Novel Flip-Chip bonding technology for W-band interconnections using alternate lead free solder bumps", Microwave and Wireless Component Letters IEEE, Vol. 12 (10), pp. 372-374, Oct. 2002.
-
(2002)
Microwave and Wireless Component Letters IEEE
, vol.12
, Issue.10
, pp. 372-374
-
-
Nodera, K.O.1
Ishii, T.2
Aoyama, S.3
Sugitami, S.4
Tokumitsu, M.5
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