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Volumn 171, Issue 1-3, 2003, Pages 328-332

Air mesh plasma for PCB de-smear process

Author keywords

Atmospheric air mesh plasma; Blind vias; Desmearing process; Wire bondability

Indexed keywords

ATMOSPHERIC PRESSURE; GLOW DISCHARGES; OXYGEN; OZONE; PLATING; PRINTED CIRCUIT BOARDS; SOLDERING; SURFACES;

EID: 0038382883     PISSN: 02578972     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0257-8972(03)00295-0     Document Type: Article
Times cited : (3)

References (16)
  • 15
    • 0037710406 scopus 로고
    • Surface contamination detection through wettability measurements
    • London: Plenum Press
    • Schrader M.E. Surface contamination detection through wettability measurements Surface Contamination: Its Genesis, Detection and Control, vol. 2 1979 697 712 Plenum Press London
    • (1979) Surface Contamination: Its Genesis, Detection and Control , vol.2 , pp. 697-712
    • Schrader, M.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.