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Volumn 42, Issue 5 B, 2003, Pages

Atomic force microscopy observation of stretched DNA on graphite surfaces

Author keywords

Atomic force microscopy (AFM); Cisplatin; Deoxyribonucleic acid (DNA); DNA stretching; HOPG

Indexed keywords

ATOMIC FORCE MICROSCOPY; GRAPHITE; MOLECULES; STATISTICAL METHODS;

MOLECULAR SUBSTRATE INTERACTION;

DNA;

EID: 0038380686 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.42.l559 Document Type: Article

Times cited : (5)

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