XPS and electrical studies of buried interfaces in Cu(In, Ga)Se2 solar cells

Thin Solid Films

Volumn 403-404, Issue , 2002, Pages 425-431

  Canava, B ^a   Vigneron, J ^a   Etcheberry, A ^a   Guimard, D ^b   Guillemoles, J F ^b   Lincot, D ^b   Ould Saad Hamatly, S ^c   Djebbour, Z ^c   Mencaraglia, D ^c  

^a UNIVERSITÉ DE VERSAILLES SAINT QUENTIN EN YVELINES   (France)

^b PSL RESEARCH UNIVERSITY   (France)

^c UNIV PARIS SUD   (France)

Author keywords

Buried interface; CuInSe2; Electrical response; Surface treatments; XPS

Indexed keywords

COMPOSITION EFFECTS; COPPER COMPOUNDS; DEPOSITION; INTERFACES (MATERIALS); SPUTTERING; SURFACE CHEMISTRY; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRICAL RESPONSE;

CADMIUM SULFIDE SOLAR CELLS;

EID: 17744416382     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)01539-5     Document Type: Conference Paper

References (14)

1. 2