Thickness, strain, and temperature-dependent properties of barium strontium titanate thin films

IEEE International Symposium on Applications of Ferroelectrics

Volumn , Issue , 2002, Pages 151-154

  Maria, J P ^a   Parker, C B ^a   Kingon, A I ^a   Stauf, G ^b  

^a North Carolina State University   (United States)

^b Advanced Technology Materials Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BARIUM COMPOUNDS; COMPOSITION; ELECTRODES; FERROELECTRICITY; LATTICE CONSTANTS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; PERMITTIVITY; X RAY ANALYSIS;

FERROELECTRIC TRANSITION;

THIN FILMS;

EID: 0038341824     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

1. MCCauley, D., R.E. Newnham, and C.A. Randall, Intrinsic Size Effects in a Barium Titanate Glass Ceramic. J. Am. Ceram. Soc., 1998. 81(4): p. 979-987.
2. 3 ultrafine particles. Phys. Rev. B, 1988. 37 (10): p. 5852-5855.
3. 3 ceramics. Ferroelectrics, 1998. 206 (4): p. 337-353.
4. 3 Thin Films. Appl. Phys. Lett., 2002. accepted for publication, July 2002.
5. Cullity, B.D., Elements of X-ray Diffraction. Second edition ed, ed. M. Cohen. 1978, Reading: Addison-Wesley.
6. Al-Shareef, H.N., Metallization schemes for dielectric thin film capacitors. J. Mat. Res., 1997. 12 (2): p. 347-354.
7. Binder, K., Surface Effects on Phase Transitions in Ferroelectrics and Antiferroelectrics. Ferroelectrics, 1981. 35: p. 99-104.
8. Shaw, T.M., The effect of stress on the dielectric properties of barium strontium titanate thin films. Appl. Phys. Lett., 1999. 75 (14): p. 2129-2131.
9. Pertsev, N.A., A.G. Zembilgotov, and A.K. Tagantsev, Effect of mechanical boundary conditions on phase diagrams for epitaxial ferroelectric thin films. Phys. Rev. Lett., 1998. 80 (9): p. 1988-1991.
10. Kulwicki, B.M. and A. Amin, Pyroelectric Imaging. Symp. Proc. Int. Soc. Appl. Ferro., 1992. 1: p. 1-10.