Finite temperature micromagnetics and magnetic measurements of submicron patterned permalloy thin films

Journal of Applied Physics

Volumn 93, Issue 10 2, 2003, Pages 6814-6816

  Deak, James G ^a  

^a MICRON TECHNOLOGY INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVE FORCE; FERROMAGNETIC MATERIALS; MAGNETIC FIELDS; MAGNETIC VARIABLES MEASUREMENT; MAGNETIZATION; THERMAL EFFECTS;

MICROMAGNETICS;

MAGNETIC THIN FILMS;

EID: 0038314419     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1555334     Document Type: Conference Paper

References (17)

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16. sw curves. At 300 K the material anisotropy is only 2% of the total effective anisotropy.
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