-
1
-
-
0028496979
-
A review of production planning and scheduling models in the semiconductor industry Part II: Shop-floor control
-
R. Uzsoy, C.-Y. Lee, and L. A. Martin-Vega, "A review of production planning and scheduling models in the semiconductor industry part II: Shop-floor control," IIE Trans., vol. 26, pp. 44-54, 1994.
-
(1994)
IIE Trans.
, vol.26
, pp. 44-54
-
-
Uzsoy, R.1
Lee, C.-Y.2
Martin-Vega, L.A.3
-
2
-
-
0024055865
-
Scheduling semiconductor wafer fabrication
-
Aug.
-
L. M. Wein, "Scheduling semiconductor wafer fabrication," IEEE Trans. Semiconduct. Manufact., vol. 1, pp. 115-130, Aug. 1988.
-
(1988)
IEEE Trans. Semiconduct. Manufact.
, vol.1
, pp. 115-130
-
-
Wein, L.M.1
-
3
-
-
0023964289
-
Closed-loop job release control for VLSI circuit manufacturing
-
Feb.
-
C. R. Glassey and M. G. C. Resende, "Closed-loop job release control for VLSI circuit manufacturing," IEEE Trans. Semiconduct. Manufact., vol. 1, pp. 36-46, Feb. 1988.
-
(1988)
IEEE Trans. Semiconduct. Manufact.
, vol.1
, pp. 36-46
-
-
Glassey, C.R.1
Resende, M.G.C.2
-
4
-
-
0030407745
-
Dynamic release control policy for the semiconductor wafer fabrication lines
-
J. Kim, R. C. Leachman, and B. Suh, "Dynamic release control policy for the semiconductor wafer fabrication lines," J. Oper. Res. Soc., vol. 47, pp. 1516-1525, 1996.
-
(1996)
J. Oper. Res. Soc.
, vol.47
, pp. 1516-1525
-
-
Kim, J.1
Leachman, R.C.2
Suh, B.3
-
5
-
-
0030285650
-
Linear control rules for production control of semiconductor fabs
-
Nov.
-
C. R. Glassey, J. G. Shanthikumar, and S. Seshadri, "Linear control rules for production control of semiconductor fabs," IEEE Trans. Semiconduct. Manufact., vol. 9, pp. 536-549, Nov. 1996.
-
(1996)
IEEE Trans. Semiconduct. Manufact.
, vol.9
, pp. 536-549
-
-
Glassey, C.R.1
Shanthikumar, J.G.2
Seshadri, S.3
-
6
-
-
0028481114
-
Efficient scheduling policies to reduce mean and variance of cycle-time in semiconductor manufacturing plants
-
Aug.
-
S. C. H. Lu, D. Ramaswamy, and P. R. Kumar, "Efficient scheduling policies to reduce mean and variance of cycle-time in semiconductor manufacturing plants," IEEE Trans. Semiconduct. Manufact., vol. 7, pp. 374-388, Aug. 1994.
-
(1994)
IEEE Trans. Semiconduct. Manufact.
, vol.7
, pp. 374-388
-
-
Lu, S.C.H.1
Ramaswamy, D.2
Kumar, P.R.3
-
7
-
-
0008193301
-
Combined production and maintenance scheduling for a multiple-product, single-machine production system
-
T. W. Sloan and J. G. Shanthikumar, "Combined production and maintenance scheduling for a multiple-product, single-machine production system," Prod. Oper. Manage., vol. 9, pp. 379-399, 2000.
-
(2000)
Prod. Oper. Manage.
, vol.9
, pp. 379-399
-
-
Sloan, T.W.1
Shanthikumar, J.G.2
-
8
-
-
0028552191
-
Planning and scheduling in Japanese semiconductor manufacturing
-
I. Duenyas, J. W. Fowler, and L. W. Schruben, "Planning and scheduling in Japanese semiconductor manufacturing," J. Manuf. Syst., vol. 13, pp. 323-332, 1994.
-
(1994)
J. Manuf. Syst.
, vol.13
, pp. 323-332
-
-
Duenyas, I.1
Fowler, J.W.2
Schruben, L.W.3
-
10
-
-
0024480282
-
Applying just-in-time in a wafer fab: A case study
-
Feb.
-
L. Martin-Vega, M. Pippin, E. Gerdon, and R. Burcham, "Applying just-in-time in a wafer fab: A case study," IEEE Trans. Semiconduct. Manufact., vol. 2, pp. 16-22, Feb. 1989.
-
(1989)
IEEE Trans. Semiconduct. Manufact.
, vol.2
, pp. 16-22
-
-
Martin-Vega, L.1
Pippin, M.2
Gerdon, E.3
Burcham, R.4
-
11
-
-
0002350057
-
IBM Burlington's logistics management system
-
G. Sullivan and K. Fordyce, "IBM Burlington's logistics management system," Interfaces, vol. 20, pp. 43-64, 1990.
-
(1990)
Interfaces
, vol.20
, pp. 43-64
-
-
Sullivan, G.1
Fordyce, K.2
-
12
-
-
0040199472
-
Reducing cycle time at an IBM wafer fabrication facility
-
L. Demeester and C. S. Tang, "Reducing cycle time at an IBM wafer fabrication facility," Interfaces, vol. 26, pp. 34-49, 1996.
-
(1996)
Interfaces
, vol.26
, pp. 34-49
-
-
Demeester, L.1
Tang, C.S.2
-
13
-
-
0035342175
-
Firm characteristics, total quality management, and financial performance
-
K. B. Hendricks and V. R. Singhal, "Firm characteristics, total quality management, and financial performance," J. Oper. Manage., vol. 19, pp. 269-285, 2001.
-
(2001)
J. Oper. Manage.
, vol.19
, pp. 269-285
-
-
Hendricks, K.B.1
Singhal, V.R.2
-
14
-
-
0031235185
-
Total quality management as competitive advantage: A review and empirical study
-
S. Sakakibara, B. B. Flynn, R. G. Schroeder, and W. T. Morris, "Total quality management as competitive advantage: A review and empirical study," Manage. Sci., vol. 43, pp. 1246-1257, 1997.
-
(1997)
Manage. Sci.
, vol.43
, pp. 1246-1257
-
-
Sakakibara, S.1
Flynn, B.B.2
Schroeder, R.G.3
Morris, W.T.4
-
15
-
-
0032635867
-
Data reduction techniques and hypothesis testing of benchmarking data
-
J. A. Nickerson and T. W. Sloan, "Data reduction techniques and hypothesis testing of benchmarking data," Int. J. Prod. Res., vol. 37, pp. 1717-1741, 1999.
-
(1999)
Int. J. Prod. Res.
, vol.37
, pp. 1717-1741
-
-
Nickerson, J.A.1
Sloan, T.W.2
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