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Volumn 19, Issue 2-4, 1997, Pages 165-173
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Study of residual strains in wafer crystals by means of lattice tilt mapping
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0008487699
PISSN: 03926737
EISSN: None
Source Type: Journal
DOI: 10.1007/BF03040969 Document Type: Article |
Times cited : (14)
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References (16)
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