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Volumn 79, Issue 12, 1996, Pages 9022-9028

Si ion implantation-induced damage in fused silica probed by variable-energy positrons

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0013360439     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362579     Document Type: Article
Times cited : (22)

References (33)
  • 17
    • 85033837510 scopus 로고
    • The Proceedings of the Fourth International Workshop, edited by P. J. Schultz, G. R. Massoumi, and P. J. Simpson, AIP Conference Proceedings 218 AIP, New York
    • G. C. Aers, in Positron Beams for Solids and Surfaces, The Proceedings of the Fourth International Workshop, edited by P. J. Schultz, G. R. Massoumi, and P. J. Simpson, AIP Conference Proceedings 218 (AIP, New York, 1991).
    • (1991) Positron Beams for Solids and Surfaces
    • Aers, G.C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.