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Volumn 83, Issue 6, 1998, Pages 3423-3425
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Dependence of carrier lifetime and resistivity on annealing in InP grown by He-plasma-assisted molecular beam epitaxy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0038256882
PISSN: 00218979
EISSN: None
Source Type: Journal
DOI: 10.1063/1.367110 Document Type: Article |
Times cited : (2)
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References (7)
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