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Volumn 83, Issue 6, 1998, Pages 3423-3425

Dependence of carrier lifetime and resistivity on annealing in InP grown by He-plasma-assisted molecular beam epitaxy

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[No Author keywords available]

Indexed keywords


EID: 0038256882     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367110     Document Type: Article
Times cited : (2)

References (7)
  • 1
    • 51649137367 scopus 로고
    • For example, the special issue on low-temperature-grown GaAs and related materials, J. Electron. Mater. 22, 1373 (1993)
    • (1993) J. Electron. Mater. , vol.22 , pp. 1373


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.